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	Issue Date	Title	Author(s)
1	1996	Stress testing for product reliability in the year 2000	Chan, Anthony Hing-Hung
2	1997	Reliability considerations from chip to packaging and systems	Chan, Anthony Hing-Hung
3	1998	Product reliability through stress testing	Chan, Anthony Hing-Hung
4	1999	Product reliability through stress testing	Chan, Anthony Hing-Hung
5	1996	Product reliability and stress testing	Chan, Anthony Hing-Hung
6	1995	Product reliability and stress testing	Chan, Anthony Hing-Hung
7	1995	Overview of stress testing	Chan, Anthony Hing-Hung
8	1994	A formulation to optimize stress testing	Chan, Anthony Hing-Hung
9	1993	Component reliability problems: Their origins and manifestations	Chan, Anthony Hing-Hung
10	1996	Surface insulation resistance methodology for today's manufacturing technology	Chan, Anthony Hing-Hung
11	1994	A formulation of product reliability through environmental stress testing and screening	Chan, Anthony Hing-Hung
12	1994	Environmental stress testing	Chan, Anthony Hing-Hung
13	1995	The benefits of stress testing	Chan, Anthony Hing-Hung
14	1997	Product reliability through stress testing	Chan, Anthony Hing-Hung
15	1994	An overview of reliability and stress testing for consumer electronics	Chan, Anthony Hing-Hung
16	1997	Overview of accelerated stress testing principles	Chan, Anthony Hing-Hung
17	1996	Is the current surface insulation resistance (SIR) methodology appropriate to today's manufacturing technology?	Chan, Anthony Hing-Hung
18	1994	A formulation of environmental stress testing and screening	Chan, Anthony Hing-Hung
19	8-Jan-1991	Localized soldering by inductive heating	Chan, Anthony Hing-Hung
20	1992	Product reliability improvement with stress testing	Chan, Anthony Hing-Hung

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