Please use this identifier to cite or link to this item:
https://repository.cihe.edu.hk/jspui/handle/cihe/3367| Title: | Product reliability and stress testing | Author(s): | Chan, Anthony Hing-Hung | Author(s): | Englert, P. | Issue Date: | 1996 | Conference: | The 46th Electronic Components and Technology Conference (ECTC) | URI: | https://repository.cihe.edu.hk/jspui/handle/cihe/3367 | CIHE Affiliated Publication: | No |
| Appears in Collections: | CIS Publication |
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