Please use this identifier to cite or link to this item:
https://repository.cihe.edu.hk/jspui/handle/cihe/2941| Title: | An overview of reliability and stress testing for consumer electronics | Author(s): | Chan, Anthony Hing-Hung | Issue Date: | 1994 | Related Publication(s): | Proceedings of the 3rd International Symposium on Consumer Electronics (ISCE) | Start page: | 300 | End page: | 305 | URI: | https://repository.cihe.edu.hk/jspui/handle/cihe/2941 | CIHE Affiliated Publication: | No |
| Appears in Collections: | CIS Publication |
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