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School of Computing and Information Sciences

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Organization name
School of Computing and Information Sciences

OrgUnit's Researchers publications
(Dept/Workgroup Publication)

Refined By:
Author:  Chan, Anthony Hing-Hung
Date Issued:  [1990 TO 1999]

Results 1-20 of 20 (Search time: 0.003 seconds).

Issue DateTitleAuthor(s)
11995The benefits of stress testingChan, Anthony Hing-Hung 
21993Component reliability problems: Their origins and manifestationsChan, Anthony Hing-Hung 
31994Environmental stress testingChan, Anthony Hing-Hung 
41994A formulation of environmental stress testing and screeningChan, Anthony Hing-Hung 
51994A formulation of product reliability through environmental stress testing and screeningChan, Anthony Hing-Hung 
61994A formulation to optimize stress testingChan, Anthony Hing-Hung 
71996Is the current surface insulation resistance (SIR) methodology appropriate to today's manufacturing technology?Chan, Anthony Hing-Hung 
88-Jan-1991Localized soldering by inductive heatingChan, Anthony Hing-Hung 
91997Overview of accelerated stress testing principlesChan, Anthony Hing-Hung 
101994An overview of reliability and stress testing for consumer electronicsChan, Anthony Hing-Hung 
111995Overview of stress testingChan, Anthony Hing-Hung 
121996Product reliability and stress testingChan, Anthony Hing-Hung 
131995Product reliability and stress testingChan, Anthony Hing-Hung 
141992Product reliability improvement with stress testingChan, Anthony Hing-Hung 
151998Product reliability through stress testingChan, Anthony Hing-Hung 
161999Product reliability through stress testingChan, Anthony Hing-Hung 
171997Product reliability through stress testingChan, Anthony Hing-Hung 
181997Reliability considerations from chip to packaging and systemsChan, Anthony Hing-Hung 
191996Stress testing for product reliability in the year 2000Chan, Anthony Hing-Hung 
201996Surface insulation resistance methodology for today's manufacturing technologyChan, Anthony Hing-Hung