Please use this identifier to cite or link to this item:
https://repository.cihe.edu.hk/jspui/handle/cihe/3811
Title: | Quality photo sketch with improved deep learning structure | Author(s): | Siu, Wan Chi Chan, Anthony Hing-Hung Hui, Chun Chuen Zhang, Wenxin |
Issue Date: | 2022 | Publisher: | IEEE | Related Publication(s): | Proceedings of the 2022 IEEE Region 10 Conference (TENCON) | Start page: | 838 | End page: | 843 | Abstract: | Drawing a sketched picture from realistic scene or photo is useful. In this paper, we propose a high-quality sketch generating model using deep convolutional neural network with self-attention structure. In style-transfer investigation, how to balance and retain both information details of input and style are what we want. For sketch drawing, edges or contours are the major components to form a sketch-like image. However, how to choose edges and contours are the major topics for the model to learn. Besides, keeping a small amount of texture and shadow can give a better view of a sketch result. We resolve this problem by proposing an end-to-end jump connection with elementwise multiplication instead of addition to keep texture details of the original input, which gives highlight of edges and contours for a sketch output. Experimental results show that our new design of network surpasses other state-of-the-art models in sketch details. |
URI: | https://repository.cihe.edu.hk/jspui/handle/cihe/3811 | DOI: | 10.1109/TENCON55691.2022.9978022 | CIHE Affiliated Publication: | Yes |
Appears in Collections: | CIS Publication |
Show full item record
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.