Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/3811
DC FieldValueLanguage
dc.contributor.authorSiu, Wan Chien_US
dc.contributor.authorChan, Anthony Hing-Hungen_US
dc.contributor.authorHui, Chun Chuenen_US
dc.contributor.authorZhang, Wenxinen_US
dc.date.accessioned2023-05-25T08:33:43Z-
dc.date.available2023-05-25T08:33:43Z-
dc.date.issued2022-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/3811-
dc.description.abstractDrawing a sketched picture from realistic scene or photo is useful. In this paper, we propose a high-quality sketch generating model using deep convolutional neural network with self-attention structure. In style-transfer investigation, how to balance and retain both information details of input and style are what we want. For sketch drawing, edges or contours are the major components to form a sketch-like image. However, how to choose edges and contours are the major topics for the model to learn. Besides, keeping a small amount of texture and shadow can give a better view of a sketch result. We resolve this problem by proposing an end-to-end jump connection with elementwise multiplication instead of addition to keep texture details of the original input, which gives highlight of edges and contours for a sketch output. Experimental results show that our new design of network surpasses other state-of-the-art models in sketch details.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.titleQuality photo sketch with improved deep learning structureen_US
dc.typeconference proceedingsen_US
dc.relation.publicationProceedings of the 2022 IEEE Region 10 Conference (TENCON)en_US
dc.identifier.doi10.1109/TENCON55691.2022.9978022-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.isbn9781665450959en_US
dc.description.startpage838en_US
dc.description.endpage843en_US
dc.cihe.affiliatedYes-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.openairetypeconference proceedings-
item.openairecristypehttp://purl.org/coar/resource_type/c_5794-
item.cerifentitytypePublications-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.orcid0000-0001-8280-0367-
crisitem.author.orcid0000-0001-7479-0787-
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