Please use this identifier to cite or link to this item:
https://repository.cihe.edu.hk/jspui/handle/cihe/3393| Title: | The future of information age and challenges to accelerated stress testing | Author(s): | Chan, Anthony Hing-Hung | Issue Date: | 2006 | Conference: | The IEEE Workshop on Accelerated Stress Testing and Reliability (ASTR 2006) | URI: | https://repository.cihe.edu.hk/jspui/handle/cihe/3393 | CIHE Affiliated Publication: | No |
| Appears in Collections: | CIS Publication |
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