1. CIHE Institutional Repository
  2. Computing and Information Sciences
  3. CIS Publication
Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/3393
DC FieldValueLanguage
dc.contributor.authorChan, Anthony Hing-Hungen_US
dc.date.accessioned2022-06-13T07:51:59Z-
dc.date.available2022-06-13T07:51:59Z-
dc.date.issued2006-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/3393-
dc.titleThe future of information age and challenges to accelerated stress testingen_US
dc.typelectureen_US
dc.relation.conferenceThe IEEE Workshop on Accelerated Stress Testing and Reliability (ASTR 2006)en_US
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.cihe.affiliatedNo-
item.openairecristypehttp://purl.org/coar/resource_type/c_8544-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairetypelecture-
item.fulltextNo Fulltext-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.orcid0000-0001-7479-0787-
Appears in Collections:CIS Publication
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