Please use this identifier to cite or link to this item:
https://repository.cihe.edu.hk/jspui/handle/cihe/2912| Title: | Fundamentals of reliability and stress testing | Author(s): | Chan, Anthony Hing-Hung | Issue Date: | 2007 | Publisher: | Springer | Related Publication(s): | Micro- and opto-electronic materials and structures: Physics, mechanics, design, reliability, packaging (Volume II) | Start page: | 177 | End page: | 202 | URI: | https://repository.cihe.edu.hk/jspui/handle/cihe/2912 | CIHE Affiliated Publication: | No |
| Appears in Collections: | CIS Publication |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| Check Library Catalogue | 135 B | HTML | View/Open |
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