1. SFU Institutional Repository
  2. Computing and Information Sciences
  3. CIS Publication
Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/2912
DC FieldValueLanguage
dc.contributor.authorChan, Anthony Hing-Hungen_US
dc.date.accessioned2022-04-04T03:27:55Z-
dc.date.available2022-04-04T03:27:55Z-
dc.date.issued2007-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/2912-
dc.publisherSpringeren_US
dc.titleFundamentals of reliability and stress testingen_US
dc.typebook parten_US
dc.relation.publicationMicro- and opto-electronic materials and structures: Physics, mechanics, design, reliability, packaging (Volume II)en_US
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.isbn9780387279749en_US
dc.description.startpage177en_US
dc.description.endpage202en_US
dc.cihe.affiliatedNo-
item.fulltextWith Fulltext-
item.openairetypebook part-
item.grantfulltextopen-
item.openairecristypehttp://purl.org/coar/resource_type/c_3248-
item.cerifentitytypePublications-
crisitem.author.deptYam Pak Charitable Foundation School of Computing and Information Sciences-
crisitem.author.orcid0000-0001-7479-0787-
Appears in Collections:CIS Publication
Files in This Item:
File Description SizeFormat
Check Library Catalogue135 BHTMLView/Open
SFX Query Show simple item record

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.