Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/3360
Title: Product reliability through stress testing
Author(s): Chan, Anthony Hing-Hung 
Author(s): Parker, T. P.
Issue Date: 2000
Conference: The Annual Reliability and Maintainability Symposium (RAMS) 2000 
URI: https://repository.cihe.edu.hk/jspui/handle/cihe/3360
CIHE Affiliated Publication: No
Appears in Collections:CIS Publication

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