Please use this identifier to cite or link to this item:
https://repository.cihe.edu.hk/jspui/handle/cihe/3360| Title: | Product reliability through stress testing | Author(s): | Chan, Anthony Hing-Hung | Author(s): | Parker, T. P. | Issue Date: | 2000 | Conference: | The Annual Reliability and Maintainability Symposium (RAMS) 2000 | URI: | https://repository.cihe.edu.hk/jspui/handle/cihe/3360 | CIHE Affiliated Publication: | No |
| Appears in Collections: | CIS Publication |
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