Please use this identifier to cite or link to this item:
https://repository.cihe.edu.hk/jspui/handle/cihe/3355| Title: | Stress testing overview | Author(s): | Chan, Anthony Hing-Hung | Issue Date: | 2003 | Conference: | The IEEE Workshop on Accelerated Stress Testing (AST 2003) | URI: | https://repository.cihe.edu.hk/jspui/handle/cihe/3355 | CIHE Affiliated Publication: | No |
| Appears in Collections: | CIS Publication |
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