Please use this identifier to cite or link to this item:
https://repository.cihe.edu.hk/jspui/handle/cihe/2945| Title: | Product reliability improvement with stress testing | Author(s): | Chan, Anthony Hing-Hung | Issue Date: | 1992 | Related Publication(s): | Proceedings of the 11th AT&T Conference on Electronic Testing | Start page: | 3.4.1 | End page: | 3.4.9 | URI: | https://repository.cihe.edu.hk/jspui/handle/cihe/2945 | CIHE Affiliated Publication: | No |
| Appears in Collections: | CIS Publication |
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