Please use this identifier to cite or link to this item:
Title: Stress intensity factors and T-stress for an edge interface crack by symplectic expansion
Author(s): Leung, Andrew Yee Tak 
Author(s): Zhou, Z.
Xu, X.
Huang, Y.
Issue Date: 2013
Publisher: Elsevier
Journal: Engineering Fracture Mechanics 
Volume: 102
Start page: 334
End page: 347
An analytical method is presented for finding the complex stress intensity factors (SIFs) and T-stress at an edge bi-material interface crack. A Hamiltonian system is first established by introducing dual (conjugate) variables of displacements and stresses whose solutions are expanded in terms of the symplectic series. With the aid of the adjoint symplectic orthogonality, coefficients of the series are determined by the boundary conditions along the crack faces and along the external geometry. Analytical solutions of SIFs and T-stress are obtained simultaneously. Numerical examples including the complex mixed boundary conditions are given. Factors influencing the SIFs are discussed.
DOI: 10.1016/j.engfracmech.2013.03.007
CIHE Affiliated Publication: No
Appears in Collections:CIS Publication

SFX Query Show full item record

Google ScholarTM




Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.