Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/2327
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dc.contributor.authorLeung, Andrew Yee Taken_US
dc.contributor.otherZhou, Z.-
dc.contributor.otherXu, X.-
dc.contributor.otherHuang, Y.-
dc.date.accessioned2022-02-18T05:51:52Z-
dc.date.available2022-02-18T05:51:52Z-
dc.date.issued2013-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/2327-
dc.description.abstractAn analytical method is presented for finding the complex stress intensity factors (SIFs) and T-stress at an edge bi-material interface crack. A Hamiltonian system is first established by introducing dual (conjugate) variables of displacements and stresses whose solutions are expanded in terms of the symplectic series. With the aid of the adjoint symplectic orthogonality, coefficients of the series are determined by the boundary conditions along the crack faces and along the external geometry. Analytical solutions of SIFs and T-stress are obtained simultaneously. Numerical examples including the complex mixed boundary conditions are given. Factors influencing the SIFs are discussed.en_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.relation.ispartofEngineering Fracture Mechanicsen_US
dc.titleStress intensity factors and T-stress for an edge interface crack by symplectic expansionen_US
dc.typejournal articleen_US
dc.identifier.doi10.1016/j.engfracmech.2013.03.007-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.issn0013-7944en_US
dc.description.volume102en_US
dc.description.startpage334en_US
dc.description.endpage347en_US
dc.cihe.affiliatedNo-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
item.openairetypejournal article-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.languageiso639-1en-
crisitem.author.deptSchool of Computing and Information Sciences-
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