Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/4703
Title: Two-dimensional time-fractional nonlinear drift reaction–diffusion equation arising in electrical field
Author(s): Leung, Andrew Yee Tak 
Author(s): Anjuman
Das, S.
Issue Date: 2024
Publisher: MDPI
Journal: Fractal and Fractional 
Volume: 8
Issue: 8
Abstract: 
Diffusion equations play a crucial role in various scientific and technological domains, including mathematical biology, physics, electrical engineering, and mathematics. This article presents a new formulation of the diffusion equation in the context of electrical engineering. Specifically, the behaviour of the physical quantity of charge carriers (such as concentration) is examined within semiconductor materials. The primary focus of this work is to solve the two-dimensional, time-fractional, nonlinear drift reaction–diffusion equation by applying an appropriate numerical scheme. In recent years, researchers working on nonlinear diffusion equations have proposed several numerical methods, with the shifted airfoil collocation method being one such efficient technique for solving nonlinear partial differential equations. This collocation approach effectively reduces the considered two-dimensional, time-fractional, nonlinear drift reaction–diffusion equation to a system of algebraic equations. The efficiency and effectiveness of the proposed method are validated through an error analysis, comparing the exact solution and the proposed numerical solution for a specific form of the considered mathematical model. The variations in the concentration of charge carriers, driven by the effects of drift and reaction terms, are displayed graphically as the system transitions from a fractional order to an integer order.
URI: https://repository.cihe.edu.hk/jspui/handle/cihe/4703
DOI: 10.3390/fractalfract8080456
CIHE Affiliated Publication: Yes
Appears in Collections:CIS Publication

Files in This Item:
File Description SizeFormat
View Online92 BHTMLView/Open
SFX Query Show full item record

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.