Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/3396
Title: Overview of stress testing
Author(s): Chan, Anthony Hing-Hung 
Issue Date: 1995
Conference: The IEEE/CPMT Workshop on Accelerated Stress Testing (AST 1995) 
URI: https://repository.cihe.edu.hk/jspui/handle/cihe/3396
CIHE Affiliated Publication: No
Appears in Collections:CIS Publication

SFX Query Show full item record

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.