Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/2428
DC FieldValueLanguage
dc.contributor.authorLeung, Andrew Yee Taken_US
dc.contributor.otherZhou, Z. H.-
dc.contributor.otherXu, X. S.-
dc.date.accessioned2022-03-01T08:34:48Z-
dc.date.available2022-03-01T08:34:48Z-
dc.date.issued2011-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/2428-
dc.description.abstractFracture mechanism is pertinent to minimize the catastrophic failures and optimize the structural design. An exact treatment on the electromagnetic permeable crack problems in a magnetoelectroelastic medium is presented by establishing a Hamiltonian system in terms of the symplectic eigenfunctions. The coefficients of the series are determined from the lateral boundary conditions at the crack surfaces and the outer boundary conditions along the geometric domain. Analytical formulations of intensity factors and distributions of dual variables are obtained by the symplectic expansion method. The various intensity factors are directly related to the first few terms of the non-zero eigenvalue solutions.en_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.relation.ispartofComputers & Structuresen_US
dc.titleAnalytical mode III electromagnetic permeable cracks in magnetoelectroelastic materialsen_US
dc.typejournal articleen_US
dc.identifier.doi10.1016/j.compstruc.2011.01.008-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.issn0045-7949en_US
dc.description.volume89en_US
dc.description.issue7-8en_US
dc.description.startpage631en_US
dc.description.endpage645en_US
dc.cihe.affiliatedNo-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypejournal article-
item.languageiso639-1en-
crisitem.author.deptSchool of Computing and Information Sciences-
Appears in Collections:CIS Publication
SFX Query Show simple item record

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.