Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/1000
Title: Initial investigation of Hong Kong post-secondary students' learning patterns
Author(s): Law, Dennis Chung Sea 
Author(s): Meyer, J. H. F.
Issue Date: 2011
Publisher: Emerald Publishing
Journal: Quality Assurance in Education 
Volume: 19
Issue: 4
Start page: 335
End page: 356
Abstract: 
Purpose
The purpose of the present study is to report the initial analyses of relationships between various components of the learning patterns exhibited by a group of 1,572 post‐secondary students in Hong Kong as operationalized via the Inventory of Learning Styles (ILS), a quantitative instrument developed by Vermunt originally for the Dutch higher education context.

Design/methodology/approach
The ILS was adapted and translated into Chinese for the new response‐context. After validation of the ILS scales (results reported in another paper), the possible direct, indirect, or spurious effects among the learning constructs operationalized by these scales were explored using a general theoretical model proposed by Richardson, according to the exhibited statistical significance and magnitude of the beta weights derived from multiple regression analyses.

Findings
Empirical support was found in this new Chinese response‐context for the theoretical model that underpins the ILS. In particular, the findings confirm the central explanatory role of regulation strategies in students’ learning patterns, as originally hypothesized by Vermunt.

Originality/value
The present study contributes to the ILS literature by expanding the application of the instrument to a new Chinese response‐context. It is also believed to be the first attempt to adapt Richardson's general theoretical model to analyse the relationships between the ILS components.
URI: https://repository.cihe.edu.hk/jspui/handle/cihe/1000
DOI: 10.1108/09684881111170069
CIHE Affiliated Publication: Yes
Appears in Collections:HL Publication

Files in This Item:
File Description SizeFormat
View Online237 BHTMLView/Open
Check Library Catalogue138 BHTMLView/Open
SFX Query Show full item record

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.