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Issue DateTitleAuthor(s)
11997Reliability considerations from chip to packaging and systemsChan, Anthony Hing-Hung 
21997Product reliability through stress testingChan, Anthony Hing-Hung 
31996Stress testing for product reliability in the year 2000Chan, Anthony Hing-Hung 
41995Overview of stress testingChan, Anthony Hing-Hung 
51996Is the current surface insulation resistance (SIR) methodology appropriate to today's manufacturing technology?Chan, Anthony Hing-Hung 
61994A formulation to optimize stress testingChan, Anthony Hing-Hung 
71996Product reliability and stress testingChan, Anthony Hing-Hung 
81992Product reliability improvement with stress testingChan, Anthony Hing-Hung 
91995Product reliability and stress testingChan, Anthony Hing-Hung 
101994A formulation of product reliability through environmental stress testing and screeningChan, Anthony Hing-Hung 

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