Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/3810
DC FieldValueLanguage
dc.contributor.authorSiu, Wan Chien_US
dc.contributor.authorChan, Anthony Hing-Hungen_US
dc.contributor.otherCheng, X.-
dc.date.accessioned2023-05-25T08:24:57Z-
dc.date.available2023-05-25T08:24:57Z-
dc.date.issued2022-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/3810-
dc.description.abstractImage super-resolution is an extremely useful way to improve the quality of an image. It is miracle that making use of the current signal processing and deep learning technologies, the image can look much appealing after the super-solution. This review paper is to highlight important techniques, especially to point out recent key contributions to make superior success of super-resolution of the recent years, especially on face super-resolution. We will start with a very brief and quick review on using conventional signal processing and classic learning approaches for super-resolution, and then concentrate on giving the advantages of deep learning, in particular, the recent powerful concepts on using latent vector and facial priors to achieve superior performance. Further topics of discussion include generative adversarial network (GAN), StyleGAN, latent space, facial priors and diffusion models. Our concentration is on the reasons for the success of these techniques. Attractive demonstrations on a few state-of-the-art models, including some of our work, are provided.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.titleCritical review on deep learning and smart technologies for image super-resolutionen_US
dc.typeconference proceedingsen_US
dc.relation.publicationProceedings of the 2022 IEEE Region 10 Conference (TENCON)en_US
dc.identifier.doi10.1109/TENCON55691.2022.9977489-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.isbn9781665450959en_US
dc.description.startpage768en_US
dc.description.endpage775en_US
dc.cihe.affiliatedYes-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_5794-
item.openairetypeconference proceedings-
item.languageiso639-1en-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.orcid0000-0001-8280-0367-
crisitem.author.orcid0000-0001-7479-0787-
Appears in Collections:CIS Publication
SFX Query Show simple item record

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.