Please use this identifier to cite or link to this item:
https://repository.cihe.edu.hk/jspui/handle/cihe/3356
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chan, Anthony Hing-Hung | en_US |
dc.date.accessioned | 2022-06-09T09:38:09Z | - |
dc.date.available | 2022-06-09T09:38:09Z | - |
dc.date.issued | 2003 | - |
dc.identifier.uri | https://repository.cihe.edu.hk/jspui/handle/cihe/3356 | - |
dc.title | Advanced packaging | en_US |
dc.type | lecture | en_US |
dc.relation.conference | The IEEE Workshop on Accelerated Stress Testing (AST 2003) | en_US |
dc.contributor.affiliation | School of Computing and Information Sciences | en_US |
dc.cihe.affiliated | No | - |
item.cerifentitytype | Publications | - |
item.fulltext | No Fulltext | - |
item.openairecristype | http://purl.org/coar/resource_type/c_8544 | - |
item.grantfulltext | none | - |
item.openairetype | lecture | - |
crisitem.author.dept | Yam Pak Charitable Foundation School of Computing and Information Sciences | - |
crisitem.author.orcid | 0000-0001-7479-0787 | - |
Appears in Collections: | CIS Publication |
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