Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/3280
DC FieldValueLanguage
dc.contributor.authorLeung, Andrew Yee Taken_US
dc.contributor.otherWong, S. C.-
dc.date.accessioned2022-05-23T02:14:30Z-
dc.date.available2022-05-23T02:14:30Z-
dc.date.issued1988-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/3280-
dc.description.abstractA thin plate subject to concentrated loads (forces or moments) is customarily analyzed either by fine finite-element mesh or by singular elements. This paper recommends an alternative method using conventional finite elements with fine mesh and reducing the number of unknowns by interpolating the nodal displacements by means of the shape functions associated with the previously mentioned singular elements. New element matrices need not be generated and integration is avoided completely. Accurate results under the point load are achieved by a substantially reduced number of unknowns. Both concentrated forces and moments are considered. Accurate superelements can be formed to study plate systems. The procedure presented in this article results in substantially reduced computational effort, and is therefore specially suited for use on microcomputers.en_US
dc.language.isoenen_US
dc.publisherJohn Wiley & Sonsen_US
dc.relation.ispartofMicrocomputers in Civil Engineeringen_US
dc.titleTwo-level finite-element method for thin plates subject to concentrated loadsen_US
dc.typejournal articleen_US
dc.identifier.doi10.1111/j.1467-8667.1988.tb00162.x-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.issn2162-6316en_US
dc.description.volume3en_US
dc.description.issue2en_US
dc.description.startpage127en_US
dc.description.endpage136en_US
dc.cihe.affiliatedNo-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypejournal article-
item.languageiso639-1en-
crisitem.author.deptSchool of Computing and Information Sciences-
Appears in Collections:CIS Publication
SFX Query Show simple item record

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.