Please use this identifier to cite or link to this item:
https://repository.cihe.edu.hk/jspui/handle/cihe/3110| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Leung, Andrew Yee Tak | en_US |
| dc.contributor.other | Hu, J. D. | - |
| dc.date.accessioned | 2022-05-07T07:19:13Z | - |
| dc.date.available | 2022-05-07T07:19:13Z | - |
| dc.date.issued | 1997 | - |
| dc.identifier.uri | https://repository.cihe.edu.hk/jspui/handle/cihe/3110 | - |
| dc.description.abstract | The two-dimensional elasticity problem of a circular ring or a hollow cylinder with a radial crack and subjected to crack surface shear stress is considered. Using dislocation pile-up and singular integral equation techniques, Mode II stress intensity factors are obtained. The crack may be an internal edge crack, an external edge crack, or an embedded crack. Numerical examples are given, for various crack geometries and radius ratios. The numerical results are obtained for a uniform crack surface shear stress τ0. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier | en_US |
| dc.relation.ispartof | International Journal of Pressure Vessels and Piping | en_US |
| dc.title | Mode II stress intensity factors for a circular ring or a hollow cylinder with a radial crack | en_US |
| dc.type | journal article | en_US |
| dc.identifier.doi | 10.1016/S0308-0161(97)00021-5 | - |
| dc.contributor.affiliation | School of Computing and Information Sciences | en_US |
| dc.relation.issn | 0308-0161 | en_US |
| dc.description.volume | 72 | en_US |
| dc.description.issue | 2 | en_US |
| dc.description.startpage | 149 | en_US |
| dc.description.endpage | 156 | en_US |
| dc.cihe.affiliated | No | - |
| item.grantfulltext | none | - |
| item.fulltext | No Fulltext | - |
| item.languageiso639-1 | en | - |
| item.openairetype | journal article | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.cerifentitytype | Publications | - |
| crisitem.author.dept | School of Computing and Information Sciences | - |
| Appears in Collections: | CIS Publication | |
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