Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/3022
DC FieldValueLanguage
dc.contributor.authorLeung, Andrew Yee Taken_US
dc.contributor.otherHu, W.-
dc.contributor.otherStarr, A.-
dc.contributor.otherZhou, Z.-
dc.date.accessioned2022-04-12T02:11:02Z-
dc.date.available2022-04-12T02:11:02Z-
dc.date.issued2001-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/3022-
dc.description.abstractThe technology of neural networks and expert systems are finding increasing applications in the field of machine tool diagnostics. In this paper, the advantages and disadvantages of these methods are analysed and compared. An intelligent integrated diagnosis system based on a combination of the two methods is presented. This scheme aims to exploit the advantages and avoid the disadvantages of neural networks and expert systems. The implementation of the intelligent integrated diagnosis system scheme is also presented. A diagnosis system based on the scheme is introduced, and is applied to the process diagnosis of an existing machining centre. The experimental results show that the integrated system scheme is feasible and effective for machine tool diagnosis tasks.en_US
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.relation.ispartofThe International Journal of Advanced Manufacturing Technologyen_US
dc.titleAn intelligent integrated system scheme for machine tool diagnosticsen_US
dc.typejournal articleen_US
dc.identifier.doi10.1007/s001700170009-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.issn1433-3015en_US
dc.description.volume18en_US
dc.description.startpage836en_US
dc.description.endpage841en_US
dc.cihe.affiliatedNo-
item.languageiso639-1en-
item.fulltextNo Fulltext-
item.openairetypejournal article-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
crisitem.author.deptYam Pak Charitable Foundation School of Computing and Information Sciences-
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