Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/2944
DC FieldValueLanguage
dc.contributor.authorChan, Anthony Hing-Hungen_US
dc.date.accessioned2022-04-06T08:27:35Z-
dc.date.available2022-04-06T08:27:35Z-
dc.date.issued1993-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/2944-
dc.description.abstractIt is important to understand the root causes of component reliability problems and how they may systematically be diagnosed and eliminated using available test information. A generalized model is developed to show the relationship between where component reliability problems originate and where they are manifested. First, the model categorizes the components and their defects to distinguish their behavior toward different stress and test conditions. Hard defects are detectable with the right fault coverage but conditional or latent defects require certain applied stresses to show up. These differences in behavior will determine the effects of various processes on these components. Then, the processes in design, manufacture, testing and field-use are characterized as black-box operators that act on the component groupings. This model creates a clear linkage between where and how a component fails and the probable underlying cause of the failure. Such a global picture may then identify major areas to improve quality.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.titleComponent reliability problems: Their origins and manifestationsen_US
dc.typeconference proceedingsen_US
dc.relation.publicationProceedings of the 43rd Electronic Components and Technology Conference (ECTC)en_US
dc.identifier.doi10.1109/ECTC.1993.346846-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.isbn0780307941en_US
dc.description.startpage108en_US
dc.description.endpage115en_US
dc.cihe.affiliatedNo-
item.openairecristypehttp://purl.org/coar/resource_type/c_5794-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.languageiso639-1en-
item.openairetypeconference proceedings-
item.fulltextNo Fulltext-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.orcid0000-0001-7479-0787-
Appears in Collections:CIS Publication
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