Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/2943
DC FieldValueLanguage
dc.contributor.authorChan, Anthony Hing-Hungen_US
dc.date.accessioned2022-04-06T08:18:27Z-
dc.date.available2022-04-06T08:18:27Z-
dc.date.issued1994-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/2943-
dc.description.abstractAlthough hard-defects may be detectable in factory tests, weak products may exhibit failures or degrade only under certain stress conditions. Without stress testing, these weak products may often be shipped to customers causing early failures in the field. Early failures usually come from product weaknesses resulting in the presence of weak populations and the lower end of a broad main population for the product strength distribution. The requirements on the product strength distribution are determined by the reliability criteria and by the distribution of the lifetime maximum stress of the product. Environmental stress testing (EST), which includes corrective actions, aim at eliminating product weaknesses to achieve robustness. Environmental stress screening may augment EST, but is applicable only under certain conditions. Its applicability also depends on whether the dominating failure may be stimulated by threshold stress, cumulative stresses or their combination.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.titleA formulation of environmental stress testing and screeningen_US
dc.typeconference proceedingsen_US
dc.relation.publicationProceedings of the Annual Reliability and Maintainability Symposium (RAMS) 1994en_US
dc.identifier.doi10.1109/RAMS.1994.291089-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.isbn0780317866en_US
dc.description.startpage99en_US
dc.description.endpage104en_US
dc.cihe.affiliatedNo-
item.openairecristypehttp://purl.org/coar/resource_type/c_5794-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.languageiso639-1en-
item.openairetypeconference proceedings-
item.fulltextNo Fulltext-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.orcid0000-0001-7479-0787-
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