Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/2942
DC FieldValueLanguage
dc.contributor.authorChan, Anthony Hing-Hungen_US
dc.date.accessioned2022-04-06T08:14:21Z-
dc.date.available2022-04-06T08:14:21Z-
dc.date.issued1994-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/2942-
dc.description.abstractAlthough hard-defects may be detectable in factory tests, weak products may exhibit failures or degrade only under certain stress conditions. Without stress testing, these weak products may often be shipped to customers causing early failures in the field. A candidate product for stress testing needs to get more business benefits to more than pay off the cost of stress testing. A business measure of the success of the stress testing program is the net benefit, which is the total benefit minus the total cost of the program. The optimum stress testing program maximizes this net benefit. A given unit of a product has a probability of encountering a maximum stress X during its product life. It also has a probability of possessing a product yield strength Y, which is the maximum stress the unit can survive without failure. While the strength distribution depends on the design and manufacture processes, the distribution of the maximum stress is determined by the customers' environment. A convenient picture is to construct the contour map of the joint probability distribution of X and Y. In this contour map, a unit falling in the YX region will not result in field failure. The effects of stress testing at a given maximum stress level, X/sup ST/, are shown by a dividing line on the product strength into stress test failure and stress test pass. The units in the contour map are then divided into four regions by the Y=X line and the X/sup ST/ line. The cost and benefits may now be evaluated for each region. Now the value of X/sup ST/ is a free parameter that determines the relative size of each region. The second free parameter is the fraction of units going through stress testing. These two parameters may be adjusted to maximize the net benefit of the stress testing program.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.titleA formulation to optimize stress testingen_US
dc.typeconference proceedingsen_US
dc.relation.publicationProceedings of the 44th Electronic Components and Technology Conference (ECTC)en_US
dc.identifier.doi10.1109/ECTC.1994.367502-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.isbn0780309146en_US
dc.description.startpage1020en_US
dc.description.endpage1027en_US
dc.cihe.affiliatedNo-
item.openairecristypehttp://purl.org/coar/resource_type/c_5794-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.languageiso639-1en-
item.openairetypeconference proceedings-
item.fulltextNo Fulltext-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.orcid0000-0001-7479-0787-
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