Please use this identifier to cite or link to this item:
https://repository.cihe.edu.hk/jspui/handle/cihe/2913
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chan, Anthony Hing-Hung | - |
dc.contributor.editor | Chan, Anthony Hing-Hung | en_US |
dc.contributor.other | Englert, P. (editor) | - |
dc.date.accessioned | 2022-04-04T03:45:38Z | - |
dc.date.available | 2022-04-04T03:45:38Z | - |
dc.date.issued | 2001 | - |
dc.identifier.uri | https://repository.cihe.edu.hk/jspui/handle/cihe/2913 | - |
dc.publisher | IEEE | - |
dc.title | Accelerated stress testing handbook: Guide for achieving quality products | en_US |
dc.type | book | en_US |
dc.relation.isbn | 0780360257 | en_US |
dc.cihe.affiliated | No | - |
item.fulltext | With Fulltext | - |
item.openairetype | book | - |
item.grantfulltext | open | - |
item.openairecristype | http://purl.org/coar/resource_type/c_2f33 | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | Yam Pak Charitable Foundation School of Computing and Information Sciences | - |
crisitem.author.orcid | 0000-0001-7479-0787 | - |
Appears in Collections: | CIS Publication |
Files in This Item:
File | Description | Size | Format | |
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Check Library Catalogue | 135 B | HTML | View/Open |
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