Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/2575
DC FieldValueLanguage
dc.contributor.authorLeung, Andrew Yee Taken_US
dc.contributor.otherGuo, X.-
dc.contributor.otherJiang, H.-
dc.contributor.otherHe, X. Q.-
dc.contributor.otherHuang, Y.-
dc.date.accessioned2022-03-15T07:31:56Z-
dc.date.available2022-03-15T07:31:56Z-
dc.date.issued2007-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/2575-
dc.description.abstractThis paper employs the atomic-scale finite element method (AFEM) to study critical strain of axial buckling for carbon nanotubes (CNTs). Brenner et al. “second-generation” empirical potential is used to model covalent bonds among atoms. The computed energy curve and critical strain for (8, 0) single-walled CNT (SWNT) agree well with molecular dynamics simulations. Both local and global buckling are achieved, two corresponding buckling zones are obtained, and the global buckling behavior of SWNT with a larger aspect ratio approaches gradually to that of a column described by Euler’s formula. For double-walled CNTs with smaller ratio of length to outer diameter, the local buckling behavior can be explained by conventional shell theory very well. AFEM is an efficient way to study buckling of CNTs.en_US
dc.language.isoenen_US
dc.publisherThe American Society of Mechanical Engineersen_US
dc.relation.ispartofJournal of Applied Mechanicsen_US
dc.titleCritical strain of carbon nanotubes: An atomic-scale finite element studyen_US
dc.typejournal articleen_US
dc.identifier.doi10.1115/1.2198548-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.issn1528-9036en_US
dc.description.volume74en_US
dc.description.issue2en_US
dc.description.startpage347en_US
dc.description.endpage351en_US
dc.cihe.affiliatedNo-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.languageiso639-1en-
item.openairetypejournal article-
item.fulltextNo Fulltext-
crisitem.author.deptSchool of Computing and Information Sciences-
Appears in Collections:CIS Publication
SFX Query Show simple item record

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.