Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/2546
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dc.contributor.authorLeung, Andrew Yee Taken_US
dc.contributor.otherZhou, Z. H.-
dc.contributor.otherXu, X. S.-
dc.date.accessioned2022-03-11T01:43:39Z-
dc.date.available2022-03-11T01:43:39Z-
dc.date.issued2009-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/2546-
dc.description.abstractThis paper introduces a new analytical method to determine the stress and electric intensity factors for edge-cracked circular piezoelectric shafts using Hamiltonian formalism. The singularities near the crack tip are represented in terms of exponential series that can show the boundary layer effects effectively. A symplectic system is established directly by introducing dual vectors in terms of the symplectic eigenfunctions. The coefficients of the series are determined from the lateral boundary conditions along the crack faces and the outer boundary conditions along the exterior geometric domain. The intensity factors are determined by the first two coefficients of non-zero eigenvalue solutions. Numerical examples for various boundary conditions are given. The influencing parameters on the intensity factors are investigated.en_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.relation.ispartofInternational Journal of Solids and Structuresen_US
dc.titleThe mode III stress/electric intensity factors and singularities analysis for edge-cracked circular piezoelectric shaftsen_US
dc.typejournal articleen_US
dc.identifier.doi10.1016/j.ijsolstr.2009.06.005-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.issn0020-7683en_US
dc.description.volume46en_US
dc.description.issue20en_US
dc.description.startpage3577en_US
dc.description.endpage3586en_US
dc.cihe.affiliatedNo-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
item.grantfulltextopen-
item.languageiso639-1en-
item.openairetypejournal article-
item.fulltextWith Fulltext-
crisitem.author.deptSchool of Computing and Information Sciences-
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