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Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/1317
DC FieldValueLanguage
dc.contributor.authorChan, Anthony Hing-Hungen_US
dc.contributor.otherChang, C. C.-
dc.date.accessioned2021-08-17T07:51:07Z-
dc.date.available2021-08-17T07:51:07Z-
dc.date.issued1977-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/1317-
dc.description.abstractVoltage-switching in evaporated weak-link junctions was found to take two forms, that is, either a snapback or a jump in voltage depending on the arrangement of the potential probes. The present observation is consistent with a heating model previously proposed by Iwanyshyn et al. (1970).en_US
dc.language.isoenen_US
dc.publisherIOP Publishing Ltden_US
dc.relation.ispartofJournal of Physics D: Applied Physicsen_US
dc.titleVoltage-switching effect in evaporated weak-link junctionsen_US
dc.typejournal articleen_US
dc.identifier.doi10.1088/0022-3727/10/4/002-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.issn1361-6463en_US
dc.description.volume10en_US
dc.description.issue4en_US
dc.description.startpageL33en_US
dc.description.endpageL36en_US
dc.cihe.affiliatedNo-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.openairetypejournal article-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.orcid0000-0001-7479-0787-
Appears in Collections:CIS Publication
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