Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/1308
DC FieldValueLanguage
dc.contributor.authorChan, Anthony Hing-Hungen_US
dc.contributor.otherEnglert, P. J.-
dc.contributor.otherOien, M. A.-
dc.contributor.otherRajaram, S. R.-
dc.date.accessioned2021-08-16T08:10:26Z-
dc.date.available2021-08-16T08:10:26Z-
dc.date.issued1994-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/1308-
dc.description.abstractEnvironmental stress testing (EST) is a means of systematically improving the reliability of electronic systems. In this paper, we discuss: — The background and rationale for EST; — The utility of accelerated testing to achieve robust design margins, high component quality, and well-controlled manufacturing processes; — Various issues that must be addressed to make EST a safe and effective process, including the principal modes of implementation, the application of various kinds of stress stimuli and the associated faults that are precipitated, and the classification of failure types; — Implementation issues, including methodology issues related to the stimulation and detection of failures, and the use of baseline experiments to determine the operational and destruct limits of a product, so as to arrive at a safe and effective EST regimen; and — Economic issues, including the importance of failure mode analysis and corrective action to achieve a cost-effective EST methodology.en_US
dc.language.isoenen_US
dc.publisherNokia Bell Labsen_US
dc.relation.ispartofAT&T Technical Journalen_US
dc.titleEnvironmental stress testingen_US
dc.typejournal articleen_US
dc.identifier.doi10.1002/j.1538-7305.1994.tb00581.x-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.issn8756-2324en_US
dc.description.volume73en_US
dc.description.issue2en_US
dc.description.startpage77en_US
dc.description.endpage85en_US
dc.cihe.affiliatedNo-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.languageiso639-1en-
item.openairetypejournal article-
item.fulltextNo Fulltext-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.orcid0000-0001-7479-0787-
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