Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/1307
DC FieldValueLanguage
dc.contributor.authorChan, Anthony Hing-Hungen_US
dc.date.accessioned2021-08-16T08:01:18Z-
dc.date.available2021-08-16T08:01:18Z-
dc.date.issued1994-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/1307-
dc.description.abstractAlthough hard defects may be detectable in factory tests, weak products may exhibit failures or degrade only under certain stress conditions. Without stress testing, these weak products may be shipped to customers and cause early failures in the field. These failures usually come from product weaknesses resulting in the presence of weak populations and the lower end of a broad main population for the product strength distribution. The requirements of the product strength distribution are determined by the reliability criteria and by the distribution of the lifetime maximum stress of the product. Environmental stress testing (EST), which includes corrective actions, aims at eliminating product weaknesses to achieve robustness. Enviromental stres screening (ESS) may augment EST, but is applicable only under certain conditions. Its applicablity also depends on whether the dominating failure may be stimulated by threshold stress, cumulative stresses, or their combination.en_US
dc.language.isoenen_US
dc.publisherInstitute of Environmental Sciencesen_US
dc.relation.ispartofJournal of the Institute of Environmental Sciencesen_US
dc.titleA formulation of product reliability through environmental stress testing and screeningen_US
dc.typejournal articleen_US
dc.identifier.doi10.17764/jiet.2.37.2.f2152lr317776723-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.issn1052-2883en_US
dc.description.volume37en_US
dc.description.issue2en_US
dc.description.startpage50en_US
dc.description.endpage56en_US
dc.cihe.affiliatedNo-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.languageiso639-1en-
item.openairetypejournal article-
item.fulltextNo Fulltext-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.orcid0000-0001-7479-0787-
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