Please use this identifier to cite or link to this item: https://repository.cihe.edu.hk/jspui/handle/cihe/1306
DC FieldValueLanguage
dc.contributor.authorChan, Anthony Hing-Hungen_US
dc.date.accessioned2021-08-16T07:42:27Z-
dc.date.available2021-08-16T07:42:27Z-
dc.date.issued1995-
dc.identifier.urihttps://repository.cihe.edu.hk/jspui/handle/cihe/1306-
dc.description.abstractWeak products may exhibit failures or degrade only under certain stress conditions. Stress testing includes testing after stressing the incipient defects to hard defects and testing during stressing to show marginal defects, which are followed by root cause analysis and corrective actions. A given unit of a product has a probability of encountering a maximum stress X during its product life. It also has a probability of possessing a product yield strength Y, which is the maximum stress the unit can survive without failure. A convenient picture is the contour map of the joint probability distribution of X and Y. Units in the Y < X region in this contour map will fail during the product life, whereas stress testing at a maximum stress level of X <sup>S T</sup> will capture the units in the Y < X <sup>S T</sup> region. Therefore the lines Y = X and Y = X <sup>S T</sup> divide the units into four regions, each with its cost and benefit from stress testing. The value of X <sup>S T</sup> may be adjusted to vary the relative size of each region, and therefore to maximize the net benefit.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.relation.ispartofIEEE Transactions on Components, Packaging, and Manufacturing Technology: Part Aen_US
dc.titleThe benefits of stress testingen_US
dc.typejournal articleen_US
dc.identifier.doi10.1109/95.370730-
dc.contributor.affiliationSchool of Computing and Information Sciencesen_US
dc.relation.issn1558-3678en_US
dc.description.volume18en_US
dc.description.issue1en_US
dc.description.startpage23en_US
dc.description.endpage29en_US
dc.cihe.affiliatedNo-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypejournal article-
item.languageiso639-1en-
crisitem.author.deptSchool of Computing and Information Sciences-
crisitem.author.orcid0000-0001-7479-0787-
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